Event

Language Classroom Testing Basics: the A, B, Cs

Sunday, June 23rd, 2002, 1:30 PM - 3:00 PM

Speaker: Elizabeth Hiser

(This is the first of two presentations this afternoon. The second starts at apx. 3:00.)

This presentation focuses on basic classroom assessment and testing procedures. It explains basic testing procedures and how to do simple statistics. Principles of communicative assessment and various assessment types will be explained. Also, the role of item facility and item discrimination in classroom tests, exams, and quizzes will be clarified.

Organization: Nagoya and Gifu Chapter of the Japan Association for Language Teaching (Nagoya and Gifu JALT)

Cost: JALT Members: free
Non-members: 1000 yen (for both or only one of today's two presentations)

Venue: Nagoya International Center, lecture room # 2, 3rd Fl.

Location: Nagoya City, Aichi Prefecture, Japan

Contact Nagoya and Gifu JALT

Chapter Programs