Event

About the TOEIC Test

Sunday, June 22nd, 2003, 1:30 PM - 4:30 PM

Speaker: George Van Horn

George Van Horn will describe this popular English proficiency test: its history, current use in business and academia, and comparison with other tests. He will give an overview of the test structure, example questions, and testing techniques. Finally he will lead a discussion on test "wise-ness".

Organization: Nagoya and Gifu Chapter of the Japan Association for Language Teaching (Nagoya and Gifu JALT)

Cost: JALT Members: free
Non-members: 1,000 yen

Venue: Nagoya International Center 3rd Floor (Sakuradori line from Nagoya Station, 1 stop to Kokusai Center Station)

Location: Nagoya City, Aichi Prefecture, Japan

Contact Nagoya and Gifu JALT

Chapter Programs